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Just last month, I spoke at the fully virtual Embedded Online Conference. Avoiding end of life from NAND correctable errors is a topic I’ve covered in the past, and it’s still just as relevant when it comes to flash memory lifetime.

But just how did I end up speaking at the Embedded Online Conference in the first place?

I was on the train from Frankfurt to Nuremberg for Embedded World 2019, where I was speaking on a couple of topics, and manning the tradeshow booth. I pulled out my laptop to get a little work done, and noticed the gentleman across from me was doing the same. We got to chatting, and I found out that he, Jacob Beningo, also worked in the embedded systems industry, and was looking forward to the three-day show.

Jacob was a consultant, and pitched an interesting idea about an online conference. His idea was that attendees could go to virtual sessions, handle questions through a forum interface, and there would even be a virtual “trade show” floor with product demonstrations. I was definitely interested, and it turns out Jacob was ahead of his time.

Still live, still connected

Surveying my inbox, it looks like the remaining tradeshows this year are going virtual. Fortunately, the folks at Embedded Online Conference had a head-start. They put together a really nice site, with presentations “going live” at particular times. These sessions (and the show) will remain live through July – so you can watch the talks at your own pace, and leave questions and comments too. What’s more, there is even a healthy discount on the registration page if you have been furloughed or laid off because of the Coronavirus – this is a great opportunity for training!

I’ve had some great questions from my talk, and I’m already thinking hard to come up with topics for next year’s conference. Will I see you there?

Visit the Embedded Online Conference site