WHITEPAPER

Understanding system integrity and how testing can help in preventing field failures

When a device fails in the field, consequences can be significant. In our conversations with embedded original equipment manufacturers (OEMs), one thing is certain: addressing a problem in the field is costly. Anticipating and preventing field failures enable market leaders to invest in innovation – rather than costly resource-draining diagnosis, repair, and redesign. Furthermore, as data storage needs of these devices has increased dramatically over the years, unreliable data storage can be a significant contributor to field failures.

This whitepaper discusses the different methods to long-term reliability, and how thoughtful and diligent storage testing can help ensure a rugged data storage system that contributes to preventing field failures and increasing the lifetime of an embedded device. Learn more by downloading the full whitepaper.